19th INTERNATIONAL CONFERENCE ON RELIABILITY AND STRESS-RELATED PHENOMENA IN NANOELECTRONICS ("STRESS WORKSHOP")

WEST LAFAYETTE, INDIANA (USA) | 28 SEPTEMBER - 1 OCTOBER 2026

COMMITTEE

Committee:
• IRSP committee
Prof. Ehrenfried Zschech,
Brandenburg University of Technology, Germany

Prof. Reinhold Dauskardt,
Stanford University, USA

Prof. Taek-Soo Kim,
Korea Advanced Institute of Science and Technology, Korea

Prof. Olivier Thomas,
Universite Aix-Marseille, France



Local committee:
Prof. Francesca Iacopi,
imec USA, USA

Prof. Ganesh Subbarayan,
Purdue University, IN, USA

Prof. Thomas Beechem,
Purdue University, IN, USA

Prof. Paul Berger,
Ohio State University, OH, USA

Dr. John Boeckl,
Air Force Research Lab, OH, USA

Dr. Darren Crum,
Purdue Applied Research Institute, IN, USA