19th INTERNATIONAL CONFERENCE ON RELIABILITY AND STRESS-RELATED
PHENOMENA IN NANOELECTRONICS ("STRESS WORKSHOP")

WEST LAFAYETTE, INDIANA (USA) | 28 SEPTEMBER - 1 OCTOBER 2026

REGISTRATION

Registration form here (.doc)

Student Proof = please provide a copy of your student ID. It MUST be sent together with your registration form.
Note that student = enrolled in a Bachelor, Master or PhD program. The student fee does not apply for PostDoc programs.

REGISTRATION FEE INCLUDES:
access to all Sessions
eco-friendly bag
programme
abstract book (online version (.pdf))
all printed material of the conference
coffee breaks (morning & afternoon / 3 full days)
lunches (3 days)

SOCIAL EVENTS:
  • Get together
  • Conference dinner
  • Social event on last day

invitation by request ONLY.
Request deadline is 30 June 2026

IMPORTANT NOTE:
Maximum of 1 accepted Abstract (Paper) per Participant / Registration.


Participants Early (15 April 2026) Late (after 15 April 2026)
Students 600 USD 700 USD
Full Delegates 840 USD 940 USD
Invited Speakers 740 USD 840 USD
Accompanied Person (spouse) 200 USD


For logistical reasons, all participants with an ORAL or POSTER presentation should be registered until the 1st August 2026 (i.e., have effectuated the registration payment).

Cancellation Policy:
Registration cancellations must be received by 30th June 2026 for a refund and note that a 100 USD administrative fee is not refundable. Please note that refunds will be made after the conference for administrative reasons.


ONLINE REGISTRATION PAYMENT:

PARTICIPANT DETAILS
FULL NAME
AFFILIATION
COUNTRY
EMAIL
YOUR ID CODE
REGISTRATION AS
ACCOMPANYING PERSON