KEYNOTE SPEAKERS:
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Prof. Andrea Ferrari Cambridge University, UK ABSTRACT (PDF) SHORT BIO (PDF) |
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Dr. Ingrid De Wolf imec, BELGIUM ABSTRACT (PDF) SHORT BIO (PDF) |
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‘STRESS CHALLENGES FOR HIGH BANDWIDTH MEMORY (HBM) PACKAGING’ Dr. Jaesik Lee VP Package Engineering for SK Hynix America, USA ABSTRACT (PDF) SHORT BIO (PDF) |
INVITED SPEAKERS:
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Prof. Ashraf Alam Purdue University, USA ABSTRACT (PDF) SHORT BIO (PDF) |
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Prof. Albert Wang University of California, USA ABSTRACT (PDF) SHORT BIO (PDF) |
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‘STRESS-FREE? A MYTH AT THE GRAIN SCALE’ Prof. Christoph Kirchlechner KIT Karlsruhe, Germany ABSTRACT (PDF) SHORT BIO (PDF) |
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Prof. Carl Thompson MIT, USA ABSTRACT (PDF) SHORT BIO (PDF) |
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‘AUTOMATING 4D-STEM FOR FAST AND ACCURATE STRAIN MAPPING’ Dr. Daniel Nemecek TESCAN Brno, Czech Republic ABSTRACT (PDF) SHORT BIO (PDF) |
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Prof. Philip Feng University of Florida, USA ABSTRACT (PDF) SHORT BIO (PDF) |
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Prof. Joan Redwing Penn State University, USA ABSTRACT (PDF) SHORT BIO (PDF) |
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‘HIGH RESOLUTION X-RAY MICROSCOPY FOR FAULT ISOLATION IN 3D HETEROGENEOUS INTEGRATION’ Dr. Kristina Kutukova PVA Technology Hub GmbH, Germany ABSTRACT (PDF) SHORT BIO (PDF) |
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‘CRACK-DRIVEN TRANSFER PRINTING FOR FLEXIBLE ELECTRONICS’ Prof. Chi Hwan Lee Purdue University, USA ABSTRACT (PDF) SHORT BIO (PDF) |
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‘BOND WAVE MODELING AND INTERFACE STRENGTH CHARACTERIZATION IN W2W/D2W STACKS’ Dr. Mario Gonzalez imec, Belgium ABSTRACT (PDF) SHORT BIO (PDF) |
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‘3D X-RAY IMAGING OF TIME-RESOLVED THERMAL CYCLING DAMAGE IN HETEROGENEOUSLY INTEGRATED PACKAGING (HIP)’ Prof. Nikhilesh Chawla Purdue University, USA ABSTRACT (PDF) SHORT BIO (PDF) |
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Prof. Ill Ryu Seoul National University, South Korea ABSTRACT (PDF) SHORT BIO (PDF) |
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‘SELF-SENSING & BACK-CONTACT
FREE ELECTRICAL ATOMIC FORCE MICROSCOPY’ Prof. Umberto Celano Arizona State University, USA ABSTRACT (PDF) SHORT BIO (PDF) |
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‘THERMAL PHENOMENA IN NANOELECTRONICS’ Prof. Xianfan Purdue University, USA ABSTRACT (PDF) SHORT BIO (PDF) |
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'ADDITIVELY MANUFACTURED MICROWAVE ELECTRONICS FOR A SUSTAINABLE FUTURE' Prof. Yang Yang University of Technology Sydney, Australia ABSTRACT (PDF) SHORT BIO (PDF) |
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‘TRACING KILLER DEFECTS IN SiC MOS DEVICES’ Dr. Maasaki Niwa University of Tokyo, Japan ABSTRACT (PDF) SHORT BIO (PDF) |
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Prof. Babak Anasori Purdue University, USA ABSTRACT (PDF) SHORT BIO (PDF) |
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‘IDENTIFICATION OF DEFECTS RESPONSIBLE FOR THE TRANSFER CHARACTERISTICS HYSTERESIS AND BIAS TEMPERATURE INSTABILITY IN 2D FETs’ Dr. Stanislav Tyaginov imec, Belgium ABSTRACT (PDF) SHORT BIO (PDF) |
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‘MODELING HOT-ELECTRON INJECTION AND TRAPPING IN AlGaN/GaN POWER HFETs’ Prof. Pierpaolo Palestri University of Modena and Reggio Emilia, Italy ABSTRACT (PDF) SHORT BIO (PDF) |
| Prof. Marko Radosavljevic University of Notre Dame, USA ABSTRACT (PDF) SHORT BIO (PDF) |
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‘ULTRAFAST THERMAL RESPONSE OF PHASE CHANGE Ge-rich Ge-Sb-Te THIN FILMS PROBED BY TIME-RESOLVED X-RAY DIFFRACTION’ Prof. Olivier Thomas University Aix-Marseille, France ABSTRACT (PDF) SHORT BIO (PDF) |
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Prof. Patrick Fay University of Notre Dame, USA ABSTRACT (PDF) SHORT BIO (PDF) |